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TDEC
iSD-101 Integrated Shock-Wave Tester
iSD Series

iSD-101 Integrated Shock-Wave Tester

  • Single-channel sampling up to 4 MSps, 16-bit ADC
  • Integrated sensing, acquisition and storage for fast deployment
  • Built-in 8 GB storage
  • Built-in Wi-Fi for long-range telemetry; inter-unit sync accuracy 1 µs
  • PoE Ethernet interface with oscilloscope-mode support
  • 24-hour battery life
  • Metal shielding with dust- and water-resistant kit; operating temperature −30 to 60 °C
  • Mobile app support for real-time on-site monitoring

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Specifications

ItemValue
Model Specifications
Sample Rate4 MSps
ADC Resolution16bit
Channels1
Analog Input
Channels1
Input ModeSingle-ended
ADC Resolution16-bit
Input Range±5V
Input Impedance1 MΩ
Low-Pass Filter
Filter Type8th-order continuous-time elliptic low-pass filter
Dynamic Performance
DC AccuracyBetter than 0.5%
Dynamic RangeBetter than 90 dB
SNRBetter than 80 dB
Bandwidth750 kHz
Analog Channel Trigger
Trigger SourceCH1
Trigger ModeEdge trigger, window trigger
Trigger Level−5 to +5 V, full scale
External Digital Trigger
Logic Level5V TTL/CMOS
Trigger EdgeRising / falling edge
Pulse WidthGreater than 100 ns
Storage
Storage8 GB per unit
Power Supply
Power InputPOE 24V,8W
Battery Life24 hours
Environmental
Operating Temperature-30℃~60℃
Relative Humidity5% to 85%, non-condensing

Related scenarios

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